Under the direction of the Sr. Manager of Wafer Characterization, the TEM Metrology Engineer performs physical characterization and complex materials/failure analyses of product devices using advanced aberration corrected Scanning Transition Electron Microscopy (STEM) and analytical FIB/SEMs, analyzes results, summarizes findings, and makes recommendations regarding future impact to current processes or materials in development such as recording heads, HDD wafers, MRAM, or other devices. This position is located in Milpitas, California.
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Job Type
Full-time
Career Level
Mid Level
Number of Employees
5,001-10,000 employees